Abstract: This paper discusses an in-depth failure analysis in which silicon die fracture surfaces are studied using a scanning electron microscope (SEM), and direction of crack propagation and ...

Jewar: Farmer Sunil Barola stood at the edge of his farm, watching people queue in WagonRs and Swifts to buy land he had just sold near the upcoming Jewar airport in Gautam Buddha Nagar. A tent had ...

Jewar: Farmer Sunil Barola stood at the edge of his farm, watching people queue in WagonRs and Swifts to buy land he had just sold near the upcoming Jewar airport in Gautam Buddha Nagar. A tent had ...

Abstract: The dielectrics material of flip-chip ball grid arrays, Ajinomoto build-up film (ABF), crack root cause and methods to prevent it were studied. The ABF crack was observed after dielectrics ...