This publication serves as a high-level introduction to systems engineering for instrumentation and control at nuclear facilities. Systems engineering is a holistic, interdisciplinary and cooperative ...

Fundamentals of Industrial Process, Measurement, and Control (FG05) is a lecture-based course that provides an overview of industrial measurement and control. Technicians, engineers and managers learn ...

Overlay control based on DI metrology of optical targets has been the primary basis for run-to-run process control for many years. In previous work we described a scenario where optical overlay ...

This course is an introduction to the foundations of nonlinear control theory, with an emphasis on feedback stabilization. As needed, topics from differential geometry and other mathematical ...

Onto Innovation Inc. (ONTO) recently augmented its award-winning Atlas family with the introduction of the Atlas G6 optical critical dimension (OCD) metrology system. Designed specifically for the era ...

HILLSBORO, Ore.--(BUSINESS WIRE)--Lattice Semiconductor (NASDAQ: LSCC), the low power programmable leader, today extended its long-standing leadership in control FPGAs with the introduction of Lattice ...