Pattern indexing is central to electron backscatter diffraction (EBSD) analysis. Creating an effective indexing algorithm was essential in the effort to automate EBSD. There are two steps to ...
Sponsored by Gatan, Inc.Reviewed by Olivia FrostFeb 21 2025 Pattern indexing is central to electron backscatter diffraction ...
Gain insights into 4D STEM orientation mapping with STEMx OIM, a tool that enhances workflow efficiency and accuracy in nanoscale materials characterization.
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